JPH0461310B2 - - Google Patents
Info
- Publication number
- JPH0461310B2 JPH0461310B2 JP62164928A JP16492887A JPH0461310B2 JP H0461310 B2 JPH0461310 B2 JP H0461310B2 JP 62164928 A JP62164928 A JP 62164928A JP 16492887 A JP16492887 A JP 16492887A JP H0461310 B2 JPH0461310 B2 JP H0461310B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- conductor plate
- contact
- elastic conductive
- piece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 25
- 238000005259 measurement Methods 0.000 claims description 21
- 239000004020 conductor Substances 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims 2
- 229920003002 synthetic resin Polymers 0.000 description 3
- 239000000057 synthetic resin Substances 0.000 description 3
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005520 electrodynamics Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62164928A JPS649379A (en) | 1987-06-30 | 1987-06-30 | Attachment for circuit measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62164928A JPS649379A (en) | 1987-06-30 | 1987-06-30 | Attachment for circuit measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS649379A JPS649379A (en) | 1989-01-12 |
| JPH0461310B2 true JPH0461310B2 (en]) | 1992-09-30 |
Family
ID=15802506
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62164928A Granted JPS649379A (en) | 1987-06-30 | 1987-06-30 | Attachment for circuit measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS649379A (en]) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4963821A (en) * | 1989-04-14 | 1990-10-16 | Tektronix, Inc. | Probe and method for testing a populated circuit board |
-
1987
- 1987-06-30 JP JP62164928A patent/JPS649379A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS649379A (en) | 1989-01-12 |
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